The complexity with system-on-chip (SoC) design continues to grow, creating greater complexity of the corresponding design-for-test (DFT) logic required for manufacturing tests. Design teams are ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
Non-terrestrial networks, combined with early 6G research, demand test equipment capable of handling extreme parameters and ...
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